TY - GEN
T1 - Failure time based reliability growth in product development and manufacturing
AU - Tongdan, Jin
AU - Haitao, Liao
AU - Wen, Luo
PY - 2007
Y1 - 2007
N2 - The Failure-In-Time (FIT) rate is widely used to quantify the reliability of a electronic component. It fails to indicate the portion of the failures due to either environmental or electrical stresses or issues that are related to process/handing, manufacturing and applications. To meet this end, FIT-based corrective action driven metrics are proposed to link the failure mode (FM) with components and non-component faults. First the conventional failure mode pareto is reviewed and its deficiency is discussed. Then a new index called the failure mode rate (FMR) is introduced to monitor the FM trend and evaluate the effectiveness of corrective actions (C/As). Based on the FMR, the FIT rate is extended to non-component failure mode and further to individual failure mode in predicting the reliability of electronic products. The extended FIT rate enables product designers to narrow down the root-cause of the failure, identify the C/A ownership, and estimate the MTBF improvement. The new metrics provide a guideline for prioritizing resources to attack the critical failures with the minimum cost.
AB - The Failure-In-Time (FIT) rate is widely used to quantify the reliability of a electronic component. It fails to indicate the portion of the failures due to either environmental or electrical stresses or issues that are related to process/handing, manufacturing and applications. To meet this end, FIT-based corrective action driven metrics are proposed to link the failure mode (FM) with components and non-component faults. First the conventional failure mode pareto is reviewed and its deficiency is discussed. Then a new index called the failure mode rate (FMR) is introduced to monitor the FM trend and evaluate the effectiveness of corrective actions (C/As). Based on the FMR, the FIT rate is extended to non-component failure mode and further to individual failure mode in predicting the reliability of electronic products. The extended FIT rate enables product designers to narrow down the root-cause of the failure, identify the C/A ownership, and estimate the MTBF improvement. The new metrics provide a guideline for prioritizing resources to attack the critical failures with the minimum cost.
KW - Corrective action
KW - Failure-in-time
KW - Mean time between failures
KW - Pareto chart
UR - http://www.scopus.com/inward/record.url?scp=34547304259&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=34547304259&partnerID=8YFLogxK
U2 - 10.1109/RAMS.2007.328084
DO - 10.1109/RAMS.2007.328084
M3 - Conference contribution
AN - SCOPUS:34547304259
SN - 0780397665
SN - 9780780397668
T3 - 2007 Proceedings - Annual Reliability and Maintainability Symposium, RAMS
SP - 488
EP - 493
BT - 2007 Proceedings - Annual Reliability and Maintainability Symposium, RAMS
T2 - 2007 53rd Annual Reliability and Maintainability Sympsoium, RAMS
Y2 - 22 January 2006 through 25 January 2006
ER -