Experimental evidence of multiple stable locations for a domain wall trapped by a submicron notch

D. Lacour; J. A. Katine; L. Folks; T. Block; J. R. Childress; M. J. Carey; B. A. Gurney

doi:10.1063/1.1686893

Experimental evidence of multiple stable locations for a domain wall trapped by a submicron notch

D. Lacour, J. A. Katine, L. Folks, T. Block, J. R. Childress, M. J. Carey, B. A. Gurney

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34 Scopus citations

Abstract

The domain walls (DW) trapped by submicron notches were studied experimentally. The presence of DWs was probed through electronic transport measurements and by magnetic force microscopy (MFM). It was found that the shape and the stability of the wall appeared to be dependent on the trapping position. The results show the existence of multiple stable locations for a domain wall trapped by a submicron notch by changing the MFM scanning history.

Original language	English (US)
Pages (from-to)	1910-1912
Number of pages	3
Journal	Applied Physics Letters
Volume	84
Issue number	11
DOIs	https://doi.org/10.1063/1.1686893
State	Published - Mar 15 2004
Externally published	Yes

ASJC Scopus subject areas

Physics and Astronomy (miscellaneous)

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abstract = "The domain walls (DW) trapped by submicron notches were studied experimentally. The presence of DWs was probed through electronic transport measurements and by magnetic force microscopy (MFM). It was found that the shape and the stability of the wall appeared to be dependent on the trapping position. The results show the existence of multiple stable locations for a domain wall trapped by a submicron notch by changing the MFM scanning history.",

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AU - Lacour, D.

AU - Katine, J. A.

AU - Folks, L.

AU - Block, T.

AU - Childress, J. R.

AU - Carey, M. J.

AU - Gurney, B. A.

PY - 2004/3/15

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AB - The domain walls (DW) trapped by submicron notches were studied experimentally. The presence of DWs was probed through electronic transport measurements and by magnetic force microscopy (MFM). It was found that the shape and the stability of the wall appeared to be dependent on the trapping position. The results show the existence of multiple stable locations for a domain wall trapped by a submicron notch by changing the MFM scanning history.

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Experimental evidence of multiple stable locations for a domain wall trapped by a submicron notch

Abstract

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