TY - GEN
T1 - Event-driven framework for configurable runtime system observability for SOC designs
AU - Lee, Jong Chul
AU - Kouteib, Faycel
AU - Lysecky, Roman
PY - 2012
Y1 - 2012
N2 - The deep integration of software and hardware components within complex system-on-chip (SOC) designs prevents the use of traditional analysis and debug methods to observe the internal state of these components. This situation is further exacerbated for in-situ debugging, verification, and certification efforts in which physical access to traditional debug and trace interfaces is unavailable, infeasible, or cost prohibitive. In this paper, we present an overview of an event-driven system-level observation framework that provides low-overhead methods for observing and analyzing designer specified hardware and software events at runtime.
AB - The deep integration of software and hardware components within complex system-on-chip (SOC) designs prevents the use of traditional analysis and debug methods to observe the internal state of these components. This situation is further exacerbated for in-situ debugging, verification, and certification efforts in which physical access to traditional debug and trace interfaces is unavailable, infeasible, or cost prohibitive. In this paper, we present an overview of an event-driven system-level observation framework that provides low-overhead methods for observing and analyzing designer specified hardware and software events at runtime.
UR - http://www.scopus.com/inward/record.url?scp=84873116244&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84873116244&partnerID=8YFLogxK
U2 - 10.1109/TEST.2012.6401554
DO - 10.1109/TEST.2012.6401554
M3 - Conference contribution
AN - SCOPUS:84873116244
SN - 9781467315951
T3 - Proceedings - International Test Conference
BT - ITC 2012 - International Test Conference 2012, Proceedings
T2 - 2012 International Test Conference, ITC 2012
Y2 - 6 November 2012 through 8 November 2012
ER -