Evaluation of Inhomogeneous Resistive Layers By a Four Point Method

György Fodor, Miklós Szilágyi, L. Zombory

Research output: Contribution to journalArticlepeer-review

1 Scopus citations

Abstract

This paper describes the determination of the sheet resistance of a narrow strip located in a homogeneous resistive layer of different resistivity. The application of the method for the evaluation of inhomogeneous layers used for thermoprinter head production is discussed.

Original languageEnglish (US)
Pages (from-to)211-216
Number of pages6
JournalElectrocomponent Science and Technology
Volume7
Issue number4
DOIs
StatePublished - 1981

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

Fingerprint

Dive into the research topics of 'Evaluation of Inhomogeneous Resistive Layers By a Four Point Method'. Together they form a unique fingerprint.

Cite this