Estimation of refractive index of crystal plate from Haidinger fringes

Jun Yeol Ryu, Hee Joo Choi, Choong Hwan Lee, Jonghan Jin, Myoungsik Cha

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We proposed and realized an accurate method for measuring the refractive index and physical thickness of a transparent wafer by analyzing the Haidinger fringes. Simply, we took transmitted Haidinger fringes caused by multiple reflections at the back and rear surfaces of the wafer, which worked as a Fabry-Perot eatlon. The refractive index was determined by analyzing the interferogram obtained in terms of an incidence angle at a single-shot. Based on the proposed method, the absolute value of the refractive index of a LiNbO3 wafer was estimated with an overall uncertainty of 10-4.

Original languageEnglish (US)
Title of host publication2015 11th Conference on Lasers and Electro-Optics Pacific Rim, CLEO-PR 2015
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781467371094
DOIs
StatePublished - Jan 7 2016
Externally publishedYes
Event11th Conference on Lasers and Electro-Optics Pacific Rim, CLEO-PR 2015 - Busan, Korea, Republic of
Duration: Aug 24 2015Aug 28 2015

Publication series

Name2015 11th Conference on Lasers and Electro-Optics Pacific Rim, CLEO-PR 2015
Volume4

Other

Other11th Conference on Lasers and Electro-Optics Pacific Rim, CLEO-PR 2015
Country/TerritoryKorea, Republic of
CityBusan
Period8/24/158/28/15

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Atomic and Molecular Physics, and Optics

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