Estimation and detection information trade-off for x-ray system optimization

Johnathan B. Cushing, Eric W Clarkson, Sagar Mandava, Ali Bilgin

Research output: Chapter in Book/Report/Conference proceedingConference contribution


X-ray Computed Tomography (CT) systems perform complex imaging tasks to detect and estimate system parameters, such as a baggage imaging system performing threat detection and generating reconstructions. This leads to a desire to optimize both the detection and estimation performance of a system, but most metrics only focus on one of these aspects. When making design choices there is a need for a concise metric which considers both detection and estimation information parameters, and then provides the user with the collection of possible optimal outcomes. In this paper a graphical analysis of Estimation and Detection Information Trade-off (EDIT) will be explored. EDIT produces curves which allow for a decision to be made for system optimization based on design constraints and costs associated with estimation and detection. EDIT analyzes the system in the estimation information and detection information space where the user is free to pick their own method of calculating these measures. The user of EDIT can choose any desired figure of merit for detection information and estimation information then the EDIT curves will provide the collection of optimal outcomes. The paper will first look at two methods of creating EDIT curves. These curves can be calculated using a wide variety of systems and finding the optimal system by maximizing a figure of merit. EDIT could also be found as an upper bound of the information from a collection of system. These two methods allow for the user to choose a method of calculation which best fits the constraints of their actual system.

Original languageEnglish (US)
Title of host publicationAnomaly Detection and Imaging with X-Rays (ADIX)
EditorsMichael E. Gehm, Amit Ashok, Mark A. Neifeld
ISBN (Electronic)9781510600881
StatePublished - 2016
EventAnomaly Detection and Imaging with X-Rays (ADIX) Conference - Baltimore, United States
Duration: Apr 19 2016Apr 20 2016

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X


OtherAnomaly Detection and Imaging with X-Rays (ADIX) Conference
Country/TerritoryUnited States


  • Imaging system optimization
  • Information analysis
  • Joint estimation/detection tasks

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering


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