Estimating the effective pressure on patterned wafers during STI CMP

  • J. Sorooshian
  • , L. Borucki
  • , R. Timon
  • , D. Stein
  • , D. Boning
  • , D. Hetherington
  • , A. Philipossian

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6 Scopus citations

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Keyphrases

Material Science

Engineering