Erratum: (Fabrication, Testing and Reliability of Semiconductor Lasers III (29-30 January 1998))

Mohmoud Fallahi, Kurt J. Linden, S. C. Wang

Research output: Contribution to journal › Comment/debate › peer-review

Original language	English (US)
Pages (from-to)	229
Number of pages	1
Journal	Proceedings of SPIE - The International Society for Optical Engineering
Volume	3285
State	Published - 1998
Event	Fabrication, Testing and Reliability of Semiconductor Lasers III - San Jose, CA, United States Duration: Jan 29 1998 → Jan 30 1998

ASJC Scopus subject areas

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title = "Erratum: (Fabrication, Testing and Reliability of Semiconductor Lasers III (29-30 January 1998))",

author = "Mohmoud Fallahi and Linden, {Kurt J.} and Wang, {S. C.}",

year = "1998",

language = "English (US)",

volume = "3285",

pages = "229",

journal = "Proceedings of SPIE - The International Society for Optical Engineering",

issn = "0277-786X",

publisher = "SPIE",

note = "Fabrication, Testing and Reliability of Semiconductor Lasers III ; Conference date: 29-01-1998 Through 30-01-1998",

}

TY - JOUR

T1 - Erratum

T2 - Fabrication, Testing and Reliability of Semiconductor Lasers III

AU - Fallahi, Mohmoud

AU - Linden, Kurt J.

AU - Wang, S. C.

PY - 1998

Y1 - 1998

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M3 - Comment/debate

AN - SCOPUS:0032225130

SN - 0277-786X

VL - 3285

SP - 229

JO - Proceedings of SPIE - The International Society for Optical Engineering

JF - Proceedings of SPIE - The International Society for Optical Engineering

Y2 - 29 January 1998 through 30 January 1998

ER -