@inproceedings{321e7587d88e4b5ba42870cb306ec54a,
title = "Environmentally friendly natural materials based photoacid generators for next generation photolithography",
abstract = "We describe the development of new triphenylsulfonium photoacid generators (TPS PAGs) with semifluorinated sulfonate anions containing glucose or other natural product groups, and their successful application to patterning sub-100 nm features using 254 nm and e-beam lithography. The TPS PAGs with functionalized octafluoro-3-oxapentanesulfonate were synthesized efficiently in high purity and high yield by utilizing simple and unique chemistries on 5-iodooctafluoro-3-oxapentanesulfonyl fluoride. The PAGs has been fully evaluated in terms of chemical properties, lithographic performance, environmental friendliness or toxicological impact. The PAGs are non-toxic and it is susceptible to chemical degradation and to microbial attack under aerobic/anaerobic conditions. These new PAGs are very attractive materials for high resolution photoresist applications and they are particularly useful in addressing the environmental concerns caused by PFOS and other perfluoroalkyl surfactants.",
keywords = "193nm, Degradation, EUV, PFOS, Photoacid generator (PAG), Photolithograpy, Sweet PAG",
author = "Youngjin Cho and Ouyang, {Christine Y.} and Marie Krysak and Wenjie Sun and Victor Gamez and Reyes Sierra-Alvarez and Ober, {Christopher K.}",
year = "2011",
doi = "10.1117/12.879816",
language = "English (US)",
isbn = "9780819485311",
series = "Proceedings of SPIE - The International Society for Optical Engineering",
booktitle = "Advances in Resist Materials and Processing Technology XXVIII",
note = "Advances in Resist Materials and Processing Technology XXVIII ; Conference date: 28-02-2011 Through 02-03-2011",
}