Abstract
We describe confocal self-interference microscopy with enhanced lateral resolution. A uniaxial anisotropic crystal is used to cause interference between two linearly polarized beams that are reflected from the same pointlike object in the focal plane of the objective lens. Theory and the optimal design that maximizes the sensitivity of the interference signal are presented. A numerical experiment shows a 38% decrease in the lateral FWHM for simple confocal self-interference microscopy.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 2470-2472 |
| Number of pages | 3 |
| Journal | Optics letters |
| Volume | 28 |
| Issue number | 24 |
| DOIs | |
| State | Published - Dec 15 2003 |
| Externally published | Yes |
ASJC Scopus subject areas
- Atomic and Molecular Physics, and Optics