Abstract
We investigate the potential profiles and elemental distribution of barriers in Co/ZrAlOx/Co magnetic tunnel junctions (MTJs) using electron holography (EH) and scanning transmission electron microscopy. The MTJ barriers are introduced by oxidizing a bilayer consisting with a uniform 0.45-nm Al layer and a wedge-shaped Zr layer (0-2 nm). From the scanning transmission electron microscopy, AlOx and ZrOx layers are mixed together, indicating that compact AlOx layer cannot be formed in such a bilayer structure of barriers. The EH results reveal that there are no sharp interfaces between the barrier and magnetic electrodes, which may be responsible for a smaller tunnelling magnetoresistance compared with the MTJs of Co/AlOx/Co.
Original language | English (US) |
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Pages (from-to) | 1732-1735 |
Number of pages | 4 |
Journal | Chinese Physics Letters |
Volume | 22 |
Issue number | 7 |
DOIs | |
State | Published - Jul 1 2005 |
Externally published | Yes |
ASJC Scopus subject areas
- General Physics and Astronomy