Electron-beam-induced structural changes in crystalline C60 and C70

Supapan Seraphin, Dan Zhou

Research output: Contribution to journalArticlepeer-review

21 Scopus citations


High-resolution transmission electron microscopy (HRTEM), electron diffraction, and electron energy-loss spectroscopy (EELS) were used to characterize electron-beam-induced structural transformations in crystalline samples of C60 and C7o. During these transformations, the electron-diffraction patterns became progressively more diffuse, with the outer diffraction spots disappearing first, followed in succession by the disappearance of the inner spots. We interpret this course of evolution in the diffraction patterns as evidence of degradation of the crystalline structure via the destruction of individual molecules, as opposed to electron-beam-induced motion of intact fullerene molecules. EELS analyses of the data indicate that the final state of these transformations was amorphous carbon.

Original languageEnglish (US)
Pages (from-to)1895-1899
Number of pages5
JournalJournal of Materials Research
Issue number8
StatePublished - Aug 1993

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering


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