Abstract
A series of electro-optic spatial light modulators have been measured with the Mueller matrix imaging polarimeter (MMIP). The MMIP is a dual rotating-retarder polarimeter which illuminates a sample with calibrated polarized states and analyzes the exiting polarized state over a spatially-resolved image of the sample. Images of the retardance magnitude and retardance fast axis orientation reveal the relative electric field strengths in a device with lead-lanthanum-zirconate-titanate (PLZT 9/65/35) modulating material. By measuring Mueller matrix images of the device at several different applied voltages, a quadratic electro-optic coefficient of 2 × 10-16 (m/V)2 was determined in the modulator active regions.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 161-166 |
| Number of pages | 6 |
| Journal | Proceedings of SPIE - The International Society for Optical Engineering |
| Volume | 3121 |
| DOIs | |
| State | Published - 1997 |
| Externally published | Yes |
| Event | Polarization: Measurement, Analysis, and Remote Sensing - San Diego, CA, United States Duration: Jul 30 1997 → Aug 1 1997 |
Keywords
- Imaging polarimetry
- Mueller matrix
- PLZT
- Retardance
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Computer Science Applications
- Applied Mathematics
- Electrical and Electronic Engineering