Electro-optic spatial light modulator characterization using Mueller matrix imaging

Elizabeth A. Sornsin; Russell A. Chipman

doi:10.1117/12.278966

Electro-optic spatial light modulator characterization using Mueller matrix imaging

Elizabeth A. Sornsin, Russell A. Chipman

Research output: Contribution to journal › Conference article › peer-review

1 Scopus citations

Abstract

A series of electro-optic spatial light modulators have been measured with the Mueller matrix imaging polarimeter (MMIP). The MMIP is a dual rotating-retarder polarimeter which illuminates a sample with calibrated polarized states and analyzes the exiting polarized state over a spatially-resolved image of the sample. Images of the retardance magnitude and retardance fast axis orientation reveal the relative electric field strengths in a device with lead-lanthanum-zirconate-titanate (PLZT 9/65/35) modulating material. By measuring Mueller matrix images of the device at several different applied voltages, a quadratic electro-optic coefficient of 2 × 10^-16 (m/V)² was determined in the modulator active regions.

Original language	English (US)
Pages (from-to)	161-166
Number of pages	6
Journal	Proceedings of SPIE - The International Society for Optical Engineering
Volume	3121
DOIs	https://doi.org/10.1117/12.278966
State	Published - 1997
Externally published	Yes
Event	Polarization: Measurement, Analysis, and Remote Sensing - San Diego, CA, United States Duration: Jul 30 1997 → Aug 1 1997

Keywords

Imaging polarimetry
Mueller matrix
PLZT
Retardance

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Computer Science Applications
Applied Mathematics
Electrical and Electronic Engineering

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10.1117/12.278966

Cite this

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title = "Electro-optic spatial light modulator characterization using Mueller matrix imaging",

abstract = "A series of electro-optic spatial light modulators have been measured with the Mueller matrix imaging polarimeter (MMIP). The MMIP is a dual rotating-retarder polarimeter which illuminates a sample with calibrated polarized states and analyzes the exiting polarized state over a spatially-resolved image of the sample. Images of the retardance magnitude and retardance fast axis orientation reveal the relative electric field strengths in a device with lead-lanthanum-zirconate-titanate (PLZT 9/65/35) modulating material. By measuring Mueller matrix images of the device at several different applied voltages, a quadratic electro-optic coefficient of 2 × 10-16 (m/V)2 was determined in the modulator active regions.",

keywords = "Imaging polarimetry, Mueller matrix, PLZT, Retardance",

author = "Sornsin, {Elizabeth A.} and Chipman, {Russell A.}",

year = "1997",

doi = "10.1117/12.278966",

language = "English (US)",

volume = "3121",

pages = "161--166",

journal = "Proceedings of SPIE - The International Society for Optical Engineering",

issn = "0277-786X",

publisher = "SPIE",

note = "Polarization: Measurement, Analysis, and Remote Sensing ; Conference date: 30-07-1997 Through 01-08-1997",

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TY - JOUR

T1 - Electro-optic spatial light modulator characterization using Mueller matrix imaging

AU - Sornsin, Elizabeth A.

AU - Chipman, Russell A.

PY - 1997

Y1 - 1997

N2 - A series of electro-optic spatial light modulators have been measured with the Mueller matrix imaging polarimeter (MMIP). The MMIP is a dual rotating-retarder polarimeter which illuminates a sample with calibrated polarized states and analyzes the exiting polarized state over a spatially-resolved image of the sample. Images of the retardance magnitude and retardance fast axis orientation reveal the relative electric field strengths in a device with lead-lanthanum-zirconate-titanate (PLZT 9/65/35) modulating material. By measuring Mueller matrix images of the device at several different applied voltages, a quadratic electro-optic coefficient of 2 × 10-16 (m/V)2 was determined in the modulator active regions.

AB - A series of electro-optic spatial light modulators have been measured with the Mueller matrix imaging polarimeter (MMIP). The MMIP is a dual rotating-retarder polarimeter which illuminates a sample with calibrated polarized states and analyzes the exiting polarized state over a spatially-resolved image of the sample. Images of the retardance magnitude and retardance fast axis orientation reveal the relative electric field strengths in a device with lead-lanthanum-zirconate-titanate (PLZT 9/65/35) modulating material. By measuring Mueller matrix images of the device at several different applied voltages, a quadratic electro-optic coefficient of 2 × 10-16 (m/V)2 was determined in the modulator active regions.

KW - Imaging polarimetry

KW - Mueller matrix

KW - PLZT

KW - Retardance

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U2 - 10.1117/12.278966

DO - 10.1117/12.278966

M3 - Conference article

AN - SCOPUS:0031288475

SN - 0277-786X

VL - 3121

SP - 161

EP - 166

JO - Proceedings of SPIE - The International Society for Optical Engineering

JF - Proceedings of SPIE - The International Society for Optical Engineering

T2 - Polarization: Measurement, Analysis, and Remote Sensing

Y2 - 30 July 1997 through 1 August 1997

ER -

Electro-optic spatial light modulator characterization using Mueller matrix imaging

Abstract

Keywords

ASJC Scopus subject areas

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