Efficient testing methodologies for microcameras in a gigapixel imaging system

Seo Ho Youn, Daniel L. Marks, Paul O. McLaughlin, David J. Brady, Jungsang Kim

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Abstract

Multiscale parallel imaging - based on a monocentric optical design - promises revolutionary advances in diverse imaging applications by enabling high resolution, real-time image capture over a wide field-of-view (FOV), including sport broadcast, wide-field microscopy, astronomy, and security surveillance. Recently demonstrated AWARE-2 is a gigapixel camera consisting of an objective lens and 98 microcameras spherically arranged to capture an image over FOV of 120 by 50, using computational image processing to form a composite image of 0.96 gigapixels. Since microcameras are capable of individually adjusting exposure, gain, and focus, true parallel imaging is achieved with a high dynamic range. From the integration perspective, manufacturing and verifying consistent quality of microcameras is a key to successful realization of AWARE cameras. We have developed an efficient testing methodology that utilizes a precisely fabricated dot grid chart as a calibration target to extract critical optical properties such as optical distortion, veiling glare index, and modulation transfer function to validate imaging performance of microcameras. This approach utilizes an AWARE objective lens simulator which mimics the actual objective lens but operates with a short object distance, suitable for a laboratory environment. Here we describe the principles of the methodologies developed for AWARE microcameras and discuss the experimental results with our prototype microcameras. Reference Brady, D. J., Gehm, M. E., Stack, R. A., Marks, D. L., Kittle, D. S., Golish, D. R., Vera, E. M., and Feller, S. D., "Multiscale gigapixel photography," Nature 486, 386 - 389 (2012).

Original languageEnglish (US)
Title of host publicationOptical Measurement Systems for Industrial Inspection VIII
DOIs
StatePublished - 2013
Externally publishedYes
EventOptical Measurement Systems for Industrial Inspection VIII - Munich, Germany
Duration: May 13 2013May 16 2013

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume8788
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Other

OtherOptical Measurement Systems for Industrial Inspection VIII
Country/TerritoryGermany
CityMunich
Period5/13/135/16/13

Keywords

  • Gigapixel imaging
  • Inspection
  • Methodology
  • Microcamera

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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