Abstract
Phase perturbations in the object plane of a partially coherent imaging system are found to produce artifacts in the aerial image. It is demonstrated that phase perturbations of as little as λ/30 rms can produce visible deformation in the final image for modest coherence factors, such as σc = 0.4. A combination of simulation and experiment is used to demonstrate the effects. Application to line-edge roughness in lithography is described.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 454-456 |
| Number of pages | 3 |
| Journal | Optics letters |
| Volume | 25 |
| Issue number | 7 |
| DOIs | |
| State | Published - Apr 1 2000 |
ASJC Scopus subject areas
- Atomic and Molecular Physics, and Optics