Abstract
Phase perturbations in the object plane of a partially coherent imaging system are found to produce artifacts in the aerial image. It is demonstrated that phase perturbations of as little as λ/30 rms can produce visible deformation in the final image for modest coherence factors, such as σc = 0.4. A combination of simulation and experiment is used to demonstrate the effects. Application to line-edge roughness in lithography is described.
Original language | English (US) |
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Pages (from-to) | 454-456 |
Number of pages | 3 |
Journal | Optics letters |
Volume | 25 |
Issue number | 7 |
DOIs | |
State | Published - Apr 1 2000 |
ASJC Scopus subject areas
- Atomic and Molecular Physics, and Optics