Effect of Zr/Ti ratio on the fatigue and retention behavior of sol-gel derived PZT films

G. Teowee, M. Boulton, M. N. Orr, C. D. Baertlein, R. K. Wade, D. P. Birnie, D. R. Uhlmann

Research output: Contribution to journalConference articlepeer-review

1 Scopus citations


A series of sol-gel derived PZT films with various Zr/Ti ratios-namely PT, 0/100 -20/80, 35/65, 53/47, 65/35 80/20, 94/6 and PZ, 100/0 -were prepared on platinized Si wafers. Excess PbO was added to the precursor chemistries to compensate for eventual PbO loss and also to aid in obtaining the desired perovskite phase. It was found that the phase assembly, namely the presence of tetragonal or rhombohedral perovskite phases, plays an important role in determining the fatigue and retention behavioral. PT-rich (or tetragonal) films offer better retention characteristics than those observed in PZ-rich (or rhombohedral) or PZT 53/47 films. Films with PZ-rich compositions tend to exhibit superior fatigue behavior compared with PT-rich films.

Original languageEnglish (US)
Pages (from-to)423-428
Number of pages6
JournalMaterials Research Society Symposium - Proceedings
StatePublished - 1993
EventProceedings of the 1993 Spring Meeting of the Materials Research Society - San Francisco, CA, USA
Duration: Apr 14 1993Apr 16 1993

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering


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