Effect of measurement temperature on the dielectric and ferroelectric properties of various sol-gel derived PLZT thin films

Finnbarr McCarthy; Kevin McCarthy; Gimtong Teowee; Tracie Bukowski; Tom Alexander; D. R. Uhlmann

doi:10.1080/10584589708012996

Effect of measurement temperature on the dielectric and ferroelectric properties of various sol-gel derived PLZT thin films

Finnbarr McCarthy, Kevin McCarthy, Gimtong Teowee, Tracie Bukowski, Tom Alexander, D. R. Uhlmann

Research output: Contribution to journal › Article › peer-review

Abstract

Sol-gel derived PLZT, including PbTiO₃, PbLaTiO₃ 28, PLZT 9/65/35 and PZT 53/47 films were prepared on platinized substrates. The dielectric and ferroelectric properties of the films were measured at 260K-580K. The values of polarization, coercive field, dielectric constant and dissipation factor in these films typically increased with increasing temperature. The changes in dielectric properties of the films with temperature were not sharp unlike the transitions in single crystals or bulk ceramics. The pyroelectric coefficients, on the other hand, decreased monotonically with increasing temperature in all these films.

Original language	English (US)
Pages (from-to)	213-220
Number of pages	8
Journal	Integrated Ferroelectrics
Volume	17
Issue number	1-4
DOIs	https://doi.org/10.1080/10584589708012996
State	Published - 1997

Keywords

Dielectric
PLZT
Sol-gel: ferroelectric films
Temperature

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Control and Systems Engineering
Ceramics and Composites
Condensed Matter Physics
Electrical and Electronic Engineering
Materials Chemistry

Access to Document

10.1080/10584589708012996

Cite this

@article{315b64b7ce79403dbd42b8d527f25f7c,

title = "Effect of measurement temperature on the dielectric and ferroelectric properties of various sol-gel derived PLZT thin films",

abstract = "Sol-gel derived PLZT, including PbTiO3, PbLaTiO3 28, PLZT 9/65/35 and PZT 53/47 films were prepared on platinized substrates. The dielectric and ferroelectric properties of the films were measured at 260K-580K. The values of polarization, coercive field, dielectric constant and dissipation factor in these films typically increased with increasing temperature. The changes in dielectric properties of the films with temperature were not sharp unlike the transitions in single crystals or bulk ceramics. The pyroelectric coefficients, on the other hand, decreased monotonically with increasing temperature in all these films.",

keywords = "Dielectric, PLZT, Sol-gel: ferroelectric films, Temperature",

author = "Finnbarr McCarthy and Kevin McCarthy and Gimtong Teowee and Tracie Bukowski and Tom Alexander and Uhlmann, {D. R.}",

note = "Funding Information: The financial support of the Donnelly Corporation and the Air Force Office of Scientific Research is greatly appreciated.",

year = "1997",

doi = "10.1080/10584589708012996",

language = "English (US)",

volume = "17",

pages = "213--220",

journal = "Integrated Ferroelectrics",

issn = "1058-4587",

publisher = "Taylor and Francis Ltd.",

number = "1-4",

}

TY - JOUR

T1 - Effect of measurement temperature on the dielectric and ferroelectric properties of various sol-gel derived PLZT thin films

AU - McCarthy, Finnbarr

AU - McCarthy, Kevin

AU - Teowee, Gimtong

AU - Bukowski, Tracie

AU - Alexander, Tom

AU - Uhlmann, D. R.

N1 - Funding Information: The financial support of the Donnelly Corporation and the Air Force Office of Scientific Research is greatly appreciated.

PY - 1997

Y1 - 1997

N2 - Sol-gel derived PLZT, including PbTiO3, PbLaTiO3 28, PLZT 9/65/35 and PZT 53/47 films were prepared on platinized substrates. The dielectric and ferroelectric properties of the films were measured at 260K-580K. The values of polarization, coercive field, dielectric constant and dissipation factor in these films typically increased with increasing temperature. The changes in dielectric properties of the films with temperature were not sharp unlike the transitions in single crystals or bulk ceramics. The pyroelectric coefficients, on the other hand, decreased monotonically with increasing temperature in all these films.

AB - Sol-gel derived PLZT, including PbTiO3, PbLaTiO3 28, PLZT 9/65/35 and PZT 53/47 films were prepared on platinized substrates. The dielectric and ferroelectric properties of the films were measured at 260K-580K. The values of polarization, coercive field, dielectric constant and dissipation factor in these films typically increased with increasing temperature. The changes in dielectric properties of the films with temperature were not sharp unlike the transitions in single crystals or bulk ceramics. The pyroelectric coefficients, on the other hand, decreased monotonically with increasing temperature in all these films.

KW - Dielectric

KW - PLZT

KW - Sol-gel: ferroelectric films

KW - Temperature

UR - http://www.scopus.com/inward/record.url?scp=7444248549&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=7444248549&partnerID=8YFLogxK

U2 - 10.1080/10584589708012996

DO - 10.1080/10584589708012996

M3 - Article

AN - SCOPUS:7444248549

SN - 1058-4587

VL - 17

SP - 213

EP - 220

JO - Integrated Ferroelectrics

JF - Integrated Ferroelectrics

IS - 1-4

ER -

Effect of measurement temperature on the dielectric and ferroelectric properties of various sol-gel derived PLZT thin films

Abstract

Keywords

ASJC Scopus subject areas

Access to Document

Other files and links

Fingerprint

Cite this