| Original language | English (US) |
|---|---|
| Pages (from-to) | 346-350 |
| Number of pages | 5 |
| Journal | Proceedings of the National Electronics Conference |
| Volume | 36 |
| State | Published - 1982 |
| Externally published | Yes |
ASJC Scopus subject areas
- General Engineering
EASILY TESTABLE STRUCTURE FOR LSI AND VLSI CIRCUITS.
Salim Al-Hariri, Fusun Ozguner
Research output: Contribution to journal › Conference article › peer-review