@inproceedings{04c8fe3b9be944cd95792ead8b358667,
title = "Dynamic studies of crystal growth using the AFM",
abstract = "Recent advances in AFM technology allow direct observation of solution growth and dissolution (etching) processes important in industry and nature, and direct tests of crystal growth models. We present results of studies of calcite and quartz, including real-time, in situ observations. While both crystals experience layer growth/dissolution, calcite grows by direct addition of material to growth steps without an important contribution from surface diffusion; quartz surfaces are consistent with more traditional, BCF-type growth models. Dynamic AFM observations of growth processes may allow optimization of industrial systems.",
author = "Gratz, {Andrew J.} and Hillner, {Paul E.} and Srinivas Manne and Hansma, {Paul K.}",
year = "1992",
language = "English (US)",
isbn = "0819407852",
series = "Proceedings of SPIE - The International Society for Optical Engineering",
publisher = "Publ by Int Soc for Optical Engineering",
pages = "182--185",
booktitle = "Proceedings of SPIE - The International Society for Optical Engineering",
note = "Scanning Probe Microscopies ; Conference date: 20-01-1992 Through 22-01-1992",
}