@inproceedings{beef1439963d49529bb92161e9071331,
title = "Dynamic metrology and data processing for precision freeform optics fabrication and testing",
abstract = "Dynamic metrology holds the key to overcoming several challenging limitations of conventional optical metrology, especially with regards to precision freeform optical elements. We present two dynamic metrology systems: 1) adaptive interferometric null testing; and 2) instantaneous phase shifting deflectometry, along with an overview of a gradient data processing and surface reconstruction technique. The adaptive null testing method, utilizing a deformable mirror, adopts a stochastic parallel gradient descent search algorithm in order to dynamically create a null testing condition for unknown freeform optics. The single-shot deflectometry system implemented on an iPhone uses a multiplexed display pattern to enable dynamic measurements of time-varying optical components or optics in vibration. Experimental data, measurement accuracy / precision, and data processing algorithms are discussed.",
keywords = "Data Processing, Deflectometry, Freeform Optics, Metrology, Optical Fabrication & Testing, Precision Optics",
author = "Maham Aftab and Isaac Trumper and Lei Huang and Heejoo Choi and Wenchuan Zhao and Logan Graves and Oh, {Chang Jin} and Kim, {Dae Wook}",
note = "Publisher Copyright: {\textcopyright} 2017 SPIE.; 4th European Seminar on Precision Optics Manufacturing ; Conference date: 04-04-2017 Through 05-04-2017",
year = "2017",
doi = "10.1117/12.2272353",
language = "English (US)",
series = "Proceedings of SPIE - The International Society for Optical Engineering",
publisher = "SPIE",
editor = "Rolf Rascher and Fahnle, {Oliver W.} and Christian Schopf and Christine Wunsche",
booktitle = "Fourth European Seminar on Precision Optics Manufacturing",
}