@inproceedings{ba5add2c168f465f9ec27819da239783,
title = "Dual-mode multi-wavelength snapshot interferometric system for onmachine metrology",
author = "Xiaobo Tian and Daodang Wang and Alexander Sohn and Spires, \{Oliver J.\} and Rongguang Liang",
year = "2019",
language = "English (US)",
series = "Proceedings - 34th ASPE Annual Meeting",
publisher = "American Society for Precision Engineering, ASPE",
pages = "162--165",
booktitle = "Proceedings - 34th ASPE Annual Meeting",
note = "34th Annual Meeting of the American Society for Precision Engineering, ASPE 2019 ; Conference date: 28-10-2019 Through 01-11-2019",
}