Dual-mode multi-wavelength snapshot interferometric system for onmachine metrology

Xiaobo Tian; Daodang Wang; Alexander Sohn; Oliver J. Spires; Rongguang Liang

Dual-mode multi-wavelength snapshot interferometric system for onmachine metrology

Xiaobo Tian, Daodang Wang, Alexander Sohn, Oliver J. Spires, Rongguang Liang

Optical Sciences

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Original language	English (US)
Title of host publication	Proceedings - 34th ASPE Annual Meeting
Publisher	American Society for Precision Engineering, ASPE
Pages	162-165
Number of pages	4
ISBN (Electronic)	9781887706780
State	Published - 2019
Event	34th Annual Meeting of the American Society for Precision Engineering, ASPE 2019 - Pittsburgh, United States Duration: Oct 28 2019 → Nov 1 2019

Publication series

Name	Proceedings - 34th ASPE Annual Meeting

Conference

Conference	34th Annual Meeting of the American Society for Precision Engineering, ASPE 2019
Country/Territory	United States
City	Pittsburgh
Period	10/28/19 → 11/1/19

ASJC Scopus subject areas

Geochemistry and Petrology

Cite this

Dual-mode multi-wavelength snapshot interferometric system for onmachine metrology. / Tian, Xiaobo; Wang, Daodang; Sohn, Alexander et al.
Proceedings - 34th ASPE Annual Meeting. American Society for Precision Engineering, ASPE, 2019. p. 162-165 (Proceedings - 34th ASPE Annual Meeting).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Tian, X, Wang, D, Sohn, A, Spires, OJ & Liang, R 2019, Dual-mode multi-wavelength snapshot interferometric system for onmachine metrology. in Proceedings - 34th ASPE Annual Meeting. Proceedings - 34th ASPE Annual Meeting, American Society for Precision Engineering, ASPE, pp. 162-165, 34th Annual Meeting of the American Society for Precision Engineering, ASPE 2019, Pittsburgh, United States, 10/28/19.

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title = "Dual-mode multi-wavelength snapshot interferometric system for onmachine metrology",

author = "Xiaobo Tian and Daodang Wang and Alexander Sohn and Spires, {Oliver J.} and Rongguang Liang",

year = "2019",

language = "English (US)",

series = "Proceedings - 34th ASPE Annual Meeting",

publisher = "American Society for Precision Engineering, ASPE",

pages = "162--165",

booktitle = "Proceedings - 34th ASPE Annual Meeting",

note = "34th Annual Meeting of the American Society for Precision Engineering, ASPE 2019 ; Conference date: 28-10-2019 Through 01-11-2019",

}

TY - GEN

T1 - Dual-mode multi-wavelength snapshot interferometric system for onmachine metrology

AU - Tian, Xiaobo

AU - Wang, Daodang

AU - Sohn, Alexander

AU - Spires, Oliver J.

AU - Liang, Rongguang

PY - 2019

Y1 - 2019

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M3 - Conference contribution

AN - SCOPUS:85075280166

T3 - Proceedings - 34th ASPE Annual Meeting

SP - 162

EP - 165

BT - Proceedings - 34th ASPE Annual Meeting

PB - American Society for Precision Engineering, ASPE

T2 - 34th Annual Meeting of the American Society for Precision Engineering, ASPE 2019

Y2 - 28 October 2019 through 1 November 2019

ER -

Dual-mode multi-wavelength snapshot interferometric system for onmachine metrology

Publication series

Conference

ASJC Scopus subject areas

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Cite this