@inproceedings{39438c0d12024fac8219770b15ae6e98,
title = "Dual interferometer system for measuring index of refraction",
abstract = "Geometrical limitations can sometimes preclude the accurate measurement of the bulk index of refraction. A novel dual interferometer system for measuring the bulk index of thin transparent optical materials is presented.",
author = "Goodwin, \{Eric P.\} and Sullivan, \{John J.\} and Smith, \{Daniel G.\} and Greivenkamp, \{John E.\}",
year = "2006",
doi = "10.1364/oft.2006.oftuc2",
language = "English (US)",
isbn = "1557528187",
series = "Optics InfoBase Conference Papers",
publisher = "Optical Society of America (OSA)",
booktitle = "Optical Fabrication and Testing, OFT 2006",
note = "Optical Fabrication and Testing, OFT 2006 ; Conference date: 10-10-2006 Through 10-10-2006",
}