Distortion mapping correction in aspheric null testing

M. Novak, C. Zhao, J. H. Burge

Research output: Chapter in Book/Report/Conference proceedingConference contribution

33 Scopus citations


We describe methods to correct both symmetric and asymmetric distortion mapping errors induced by null testing elements such as holograms or null lenses. We show experimental results for direct measurement and correction of symmetric mapping distortion, as well as an example result for analytical mapping performed using an orthogonal set of vector polynomials for asymmetric correction. The empirical determination of symmetric distortion is made via calculation from predicted and measured changes to aberrations induced via known changes to the testing point.

Original languageEnglish (US)
Title of host publicationInterferometry XIV
Subtitle of host publicationTechniques and Analysis
StatePublished - 2008
EventInterferometry XIV: Techniques and Analysis - San Diego, CA, United States
Duration: Aug 11 2008Aug 13 2008

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
ISSN (Print)0277-786X


OtherInterferometry XIV: Techniques and Analysis
Country/TerritoryUnited States
CitySan Diego, CA

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering


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