Disambiguation of surface normals using single-view Mueller shape-from-polarization

Lily McKenna, Quinn Jarecki, Meredith Kupinski

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Using the information contained in polarimetric measurements to estimate the surface normals of an object or scene is a well-established computer vision task referred to as shape-from-polarization (SfP). Challenges in current physics-based SfP are 1) the assumption of an ideal specular or ideal diffuse polarized bidirectional reflectance distribution function (pBRDF), and 2) the fundamental 180 ambiguity in surface normal azimuth angle which is present even when an appropriate pBRDF is chosen. In this work, we demonstrate the use of single-view Mueller matrix imaging to address these two challenges. In prior work, Mueller characterization of a material is performed to create a realistic mixed specular and diffuse pBRDF. A depth map is estimated based on the polarimetric measurements and a priori knowledge of the source and camera positions. An unambiguous surface normal is independently estimated from this depth map. Although this surface normal from depth is not expected to be precise, it is used to disambiguate the surface normal azimuth angles. The mean angular error of our single-view Mueller SfP disambiguation method is 22.9 for a 20cm distance from the source to the center of the object and 34.2 for 90cm distance for a simulated SNR of 100. This is the first deterministic method known to the authors to disambiguate the surface normals from single-view polarimetric measurements.

Original languageEnglish (US)
Title of host publicationPolarization
Subtitle of host publicationMeasurement, Analysis, and Remote Sensing XVI
EditorsDavid B. Chenault, Meredith K. Kupinski, Bradley M. Ratliff
PublisherSPIE
ISBN (Electronic)9781510674189
DOIs
StatePublished - 2024
EventPolarization: Measurement, Analysis, and Remote Sensing XVI 2024 - National Harbor, United States
Duration: Apr 22 2024Apr 23 2024

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume13050
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

ConferencePolarization: Measurement, Analysis, and Remote Sensing XVI 2024
Country/TerritoryUnited States
CityNational Harbor
Period4/22/244/23/24

Keywords

  • Mueller matrix
  • Shape-from-polarization
  • depth
  • polarization imaging

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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