@inproceedings{f287063f147d458fb156fe100d6abdec,
title = "Directly measuring adhesive and elastic properties of bacteria using a surface force apparatus",
abstract = "Bacteria are increasingly being employed as components in biosensors and biofilm reactors. It is important to understand the material properties of bacteria in dry conditions for these applications. For a decade, Atomic Force Microscopy (AFM) has been the primary tool used to study the adhesion and elastic properties of individual bacteria. In this work we show it is possible to use a Surface Forces Apparatus (SFA) to measure elastic and adhesive properties of small collections of surface bound bacteria. The measurements are conducted with submonolayer, patterned bacterial films and we have developed a protocol to image the contact area with AFM after the experiment. Using the SFA, we measured the force profile between a Pseudomonas aeruginosa PAO1 film and a bare mica surface. Pseudomonas aeruginosa PAO1 is a ubiquitous gram-negative soil bacterium and is also an opportunistic pathogen. We repeated the measurement in the same contact position for a number of days to determine the effect of desiccation on the film material properties.",
author = "Curry, {Joan E.} and Heo, {Cheol Ho} and Maier, {Raina M.}",
year = "2008",
month = may,
day = "30",
doi = "10.1021/bk-2008-0984.ch013",
language = "English (US)",
isbn = "9780841274303",
series = "ACS Symposium Series",
publisher = "American Chemical Society",
pages = "217--229",
booktitle = "Microbial Surfaces",
}