TY - JOUR
T1 - Diffraction study of duty-cycle error in ferroelectric quasi-phase-matching gratings with Gaussian beam illumination
AU - Dwivedi, Prashant Povel
AU - Kumar, Challa Sesha Sai Pavan
AU - Choi, Hee Joo
AU - Cha, Myoungsik
N1 - Funding Information:
This work was supported by the Korea Research Institute of Standards and Science under the “Metrology Research Center” project.
Publisher Copyright:
© 2016, Springer-Verlag Berlin Heidelberg.
PY - 2016/2/1
Y1 - 2016/2/1
N2 - Random duty-cycle error (RDE) is inherent in the fabrication of ferroelectric quasi-phase-matching (QPM) gratings. Although a small RDE may not affect the nonlinearity of QPM devices, it enhances non-phase-matched parasitic harmonic generations, limiting the device performance in some applications. Recently, we demonstrated a simple method for measuring the RDE in QPM gratings by analyzing the far-field diffraction pattern obtained by uniform illumination (Dwivedi et al. in Opt Express 21:30221–30226, 2013). In the present study, we used a Gaussian beam illumination for the diffraction experiment to measure noise spectra that are less affected by the pedestals of the strong diffraction orders. Our results were compared with our calculations based on a random grating model, demonstrating improved resolution in the RDE estimation.
AB - Random duty-cycle error (RDE) is inherent in the fabrication of ferroelectric quasi-phase-matching (QPM) gratings. Although a small RDE may not affect the nonlinearity of QPM devices, it enhances non-phase-matched parasitic harmonic generations, limiting the device performance in some applications. Recently, we demonstrated a simple method for measuring the RDE in QPM gratings by analyzing the far-field diffraction pattern obtained by uniform illumination (Dwivedi et al. in Opt Express 21:30221–30226, 2013). In the present study, we used a Gaussian beam illumination for the diffraction experiment to measure noise spectra that are less affected by the pedestals of the strong diffraction orders. Our results were compared with our calculations based on a random grating model, demonstrating improved resolution in the RDE estimation.
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U2 - 10.1007/s00340-015-6316-5
DO - 10.1007/s00340-015-6316-5
M3 - Article
AN - SCOPUS:84957955567
SN - 0946-2171
VL - 122
SP - 1
EP - 6
JO - Applied Physics B: Lasers and Optics
JF - Applied Physics B: Lasers and Optics
IS - 2
M1 - 34
ER -