@inproceedings{03f6818ccdfc4123bf7f25a1cd0a8271,
title = "Diffraction effects in interferometry",
abstract = "Besides the geometrical errors, interferometry suffers errors due to diffraction, because the wavefront aberrations of the test and reference beams change as they propagate. This paper addresses errors due to diffraction effects in interferometry.",
author = "Ping Zhou and Burge, {James H.}",
year = "2010",
doi = "10.1364/oft.2010.oma3",
language = "English (US)",
isbn = "9781557528933",
series = "Optics InfoBase Conference Papers",
publisher = "Optical Society of America (OSA)",
booktitle = "Optical Fabrication and Testing, OFT 2010",
note = "Optical Fabrication and Testing, OFT 2010 ; Conference date: 13-06-2010 Through 17-06-2010",
}