Differential Phase Measuring Deflectometry for On-Machine Metrology of Ultrafast Laser Stress Figuring

Marcos A. Esparza, Kevin Laverty, Brandon D. Chalifoux, Daewook Kim

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Abstract

Ultrafast laser stress figuring (ULSF) currently allows for the figuring of large aspect ratio fused silica mirrors with an accuracy of <20 nm RMS over 6 orders of Zernike polynomials. While similar technologies are capable of this accuracy, ULSF has the potential to be orders of magnitude faster. ULSF is an iterative process in which (1) an optic is figured, (2) optical metrology is used to measure the surface figure, and that measurement is used as feedback to repeat this closed-loop process and further figure the mirror until the mirror has reached the desired figure. We present an in-situ, on-machine optical metrology system that measures the mirror surface figure using differential phase measuring deflectometry (DPMD). After an absolute measurement of the surface figure is done using interferometry prior to any figuring, our differential deflectometry system can measure the change in surface figure after each laser stress figuring process. This eliminates the need to remove the mirror from its mounting, which can induce non-repeatable surface figure errors during the metrology step. The differential deflectometry system is also used to calibrate the ULSF process prior to the figuring of the mirror. We utilize and characterize the in-situ differential deflectometry system during the surface figuring of a 25.4 mm fused silica mirror and summarize the results in this proceeding.

Original languageEnglish (US)
Title of host publicationOptical Manufacturing and Testing XIV
EditorsDaewook Kim, Heejoo Choi, Heidi Ottevaere, Rolf Rascher
PublisherSPIE
ISBN (Electronic)9781510654266
DOIs
StatePublished - 2022
EventOptical Manufacturing and Testing XIV 2022 - San Diego, United States
Duration: Aug 22 2022Aug 24 2022

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume12221
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

ConferenceOptical Manufacturing and Testing XIV 2022
Country/TerritoryUnited States
CitySan Diego
Period8/22/228/24/22

Keywords

  • flat optics
  • on-machine metrology
  • space optics
  • stress figuring
  • x-ray optics

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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