Dielectric tensors via non-scanning variable angle ellipsometry

Neil A. Beaudry; Yanming Zhao; Philip McCulloch; Russell Chipman

doi:10.1364/fio.2005.fmb3

Dielectric tensors via non-scanning variable angle ellipsometry

Neil A. Beaudry, Yanming Zhao, Philip McCulloch, Russell Chipman

Optical Sciences

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

A non-scanning technique for measuring ellipsometric parameters as a function incident and azimuthal angles is presented. This technique is especially suited to measuring the dielectric tensor of arbitrarily oriented biaxial materials.

Original language	English (US)
Title of host publication	Frontiers in Optics, FiO 2005
Publisher	Optical Society of America (OSA)
ISBN (Print)	1557527970, 9781557527974
DOIs	https://doi.org/10.1364/fio.2005.fmb3
State	Published - 2005
Event	Frontiers in Optics, FiO 2005 - Tucson, AZ, United States Duration: Oct 16 2005 → Oct 21 2005

Publication series

Name	Optics InfoBase Conference Papers
ISSN (Electronic)	2162-2701

Other

Other	Frontiers in Optics, FiO 2005
Country/Territory	United States
City	Tucson, AZ
Period	10/16/05 → 10/21/05

ASJC Scopus subject areas

Instrumentation
Atomic and Molecular Physics, and Optics

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10.1364/fio.2005.fmb3

Cite this

@inproceedings{62e780ae1da54d35878e41f73cd3e37a,

title = "Dielectric tensors via non-scanning variable angle ellipsometry",

abstract = "A non-scanning technique for measuring ellipsometric parameters as a function incident and azimuthal angles is presented. This technique is especially suited to measuring the dielectric tensor of arbitrarily oriented biaxial materials.",

author = "Beaudry, {Neil A.} and Yanming Zhao and Philip McCulloch and Russell Chipman",

year = "2005",

doi = "10.1364/fio.2005.fmb3",

language = "English (US)",

isbn = "1557527970",

series = "Optics InfoBase Conference Papers",

publisher = "Optical Society of America (OSA)",

booktitle = "Frontiers in Optics, FiO 2005",

note = "Frontiers in Optics, FiO 2005 ; Conference date: 16-10-2005 Through 21-10-2005",

}

TY - GEN

T1 - Dielectric tensors via non-scanning variable angle ellipsometry

AU - Beaudry, Neil A.

AU - Zhao, Yanming

AU - McCulloch, Philip

AU - Chipman, Russell

PY - 2005

Y1 - 2005

N2 - A non-scanning technique for measuring ellipsometric parameters as a function incident and azimuthal angles is presented. This technique is especially suited to measuring the dielectric tensor of arbitrarily oriented biaxial materials.

AB - A non-scanning technique for measuring ellipsometric parameters as a function incident and azimuthal angles is presented. This technique is especially suited to measuring the dielectric tensor of arbitrarily oriented biaxial materials.

UR - http://www.scopus.com/inward/record.url?scp=85088346580&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85088346580&partnerID=8YFLogxK

U2 - 10.1364/fio.2005.fmb3

DO - 10.1364/fio.2005.fmb3

M3 - Conference contribution

AN - SCOPUS:85088346580

SN - 1557527970

SN - 9781557527974

T3 - Optics InfoBase Conference Papers

BT - Frontiers in Optics, FiO 2005

PB - Optical Society of America (OSA)

T2 - Frontiers in Optics, FiO 2005

Y2 - 16 October 2005 through 21 October 2005

ER -

Dielectric tensors via non-scanning variable angle ellipsometry

Abstract

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ASJC Scopus subject areas

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