Dielectric tensor characterization for magneto-optical recording media

Andy F. Zhou; J. Kevin Erwin; Charles F. Brucker; M. Mansuripur

doi:10.1364/AO.31.006280

Dielectric tensor characterization for magneto-optical recording media

Andy F. Zhou
, J. Kevin Erwin
, Charles F. Brucker
, M. Mansuripur

Research output: Contribution to journal › Article › peer-review

2 Scopus citations

Abstract

A new and comprehensive dielectric-tensor characterization method was used for the characterization of magneto-optical recording media. The effect of film thickness and bilayer thickness on the magneto-optic Kerr effect was studied for a series of Co-Pd samples. The composition dependencies of the dielectric tensor for both Co-Pt and Co-Pd superlattice samples were measured, and the enhancement of the magneto-optical Kerr effect for these samples was studied.

Original language	English (US)
Pages (from-to)	6280-6268
Number of pages	13
Journal	Applied optics
Volume	31
Issue number	29
DOIs	https://doi.org/10.1364/AO.31.006280
State	Published - Oct 10 1992

ASJC Scopus subject areas

Atomic and Molecular Physics, and Optics
Engineering (miscellaneous)
Electrical and Electronic Engineering

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10.1364/AO.31.006280

Cite this

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title = "Dielectric tensor characterization for magneto-optical recording media",

abstract = "A new and comprehensive dielectric-tensor characterization method was used for the characterization of magneto-optical recording media. The effect of film thickness and bilayer thickness on the magneto-optic Kerr effect was studied for a series of Co-Pd samples. The composition dependencies of the dielectric tensor for both Co-Pt and Co-Pd superlattice samples were measured, and the enhancement of the magneto-optical Kerr effect for these samples was studied.",

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AU - Zhou, Andy F.

AU - Erwin, J. Kevin

AU - Brucker, Charles F.

AU - Mansuripur, M.

PY - 1992/10/10

Y1 - 1992/10/10

N2 - A new and comprehensive dielectric-tensor characterization method was used for the characterization of magneto-optical recording media. The effect of film thickness and bilayer thickness on the magneto-optic Kerr effect was studied for a series of Co-Pd samples. The composition dependencies of the dielectric tensor for both Co-Pt and Co-Pd superlattice samples were measured, and the enhancement of the magneto-optical Kerr effect for these samples was studied.

AB - A new and comprehensive dielectric-tensor characterization method was used for the characterization of magneto-optical recording media. The effect of film thickness and bilayer thickness on the magneto-optic Kerr effect was studied for a series of Co-Pd samples. The composition dependencies of the dielectric tensor for both Co-Pt and Co-Pd superlattice samples were measured, and the enhancement of the magneto-optical Kerr effect for these samples was studied.

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U2 - 10.1364/AO.31.006280

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SP - 6280

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JO - Applied optics

JF - Applied optics

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Dielectric tensor characterization for magneto-optical recording media

Abstract

ASJC Scopus subject areas

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