A new and comprehensive dielectric-tensor characterization method was used for the characterization of magneto-optical recording media. The effect of film thickness and bilayer thickness on the magneto-optic Kerr effect was studied for a series of Co-Pd samples. The composition dependencies of the dielectric tensor for both Co-Pt and Co-Pd superlattice samples were measured, and the enhancement of the magneto-optical Kerr effect for these samples was studied.
ASJC Scopus subject areas
- Atomic and Molecular Physics, and Optics
- Engineering (miscellaneous)
- Electrical and Electronic Engineering