TY - GEN
T1 - Dielectric constant and loss tangent measurement using a stripline fixture
AU - Yue, Heping
AU - Virga, K. L.
AU - Prince, J. L.
N1 - Funding Information:
The authors would like to thank Mr. Zabic Nelson and Mr. James Clair of the Department of Aerospace and Mechanical Engineering for fabricating measurement samples. This research work is financially supported by Semiconductor Research Corporation (SRC).
Publisher Copyright:
© 1998 IEEE.
PY - 1998
Y1 - 1998
N2 - An approach to dielectric material characterization with a vector network analyzer is presented. As the characteristic impedance (Z0) of a stripline transmission line can be accurately determined by measuring the two-port scattering parameters in the frequency range of interest, the dielectric constant of the insulation material that consists of part of the stripline configuration is then obtained by relationship to the characteristic impedance. The dielectric loss (or loss tangent) can be determined by measuring the return loss and the insertion loss of the stripline. The validity of the technique is demonstrated for well-characterized dielectric materials such as Teflon-based and other composite laminates. The technique is then applied to IC molding compounds as processed.
AB - An approach to dielectric material characterization with a vector network analyzer is presented. As the characteristic impedance (Z0) of a stripline transmission line can be accurately determined by measuring the two-port scattering parameters in the frequency range of interest, the dielectric constant of the insulation material that consists of part of the stripline configuration is then obtained by relationship to the characteristic impedance. The dielectric loss (or loss tangent) can be determined by measuring the return loss and the insertion loss of the stripline. The validity of the technique is demonstrated for well-characterized dielectric materials such as Teflon-based and other composite laminates. The technique is then applied to IC molding compounds as processed.
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U2 - 10.1109/ECTC.1998.678848
DO - 10.1109/ECTC.1998.678848
M3 - Conference contribution
AN - SCOPUS:0031636962
SN - 0780345266
T3 - Proceedings - Electronic Components and Technology Conference
SP - 1077
EP - 1082
BT - 1998 Proceedings - 48th Electronic Components and Technology Conference, ECTC 1998
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 48th Electronic Components and Technology Conference, ECTC 1998
Y2 - 25 May 1998 through 28 May 1998
ER -