An approach to dielectric material characterization with a vector network analyzer is presented. As the characteristic impedance (Z0) of a stripline transmission line can be accurately determined by measuring the two-port scattering parameters in the frequency range of interest, the dielectric constant of the insulation material that consists of part of the stripline configuration is then obtained by relationship to the characteristic impedance. The dielectric loss (or loss tangent) can be determined by measuring the return loss and the insertion loss of the stripline. The validity of the technique is demonstrated for well-characterized dielectric materials such as Teflon-based and other composite laminates. The technique is then applied to IC molding compounds as processed.
|Title of host publication
|1998 Proceedings - 48th Electronic Components and Technology Conference, ECTC 1998
|Institute of Electrical and Electronics Engineers Inc.
|Number of pages
|Published - 1998
|48th Electronic Components and Technology Conference, ECTC 1998 - Seattle, United States
Duration: May 25 1998 → May 28 1998
|Proceedings - Electronic Components and Technology Conference
|48th Electronic Components and Technology Conference, ECTC 1998
|5/25/98 → 5/28/98
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Electrical and Electronic Engineering