@inproceedings{3e910f60d38a45a68f20487a41481d76,
title = "Determination of refractive indices of optical wafers by interferometric method",
abstract = "For accurate index measurement, we investigated Fabry-Perot type interference from optical wafers. Since this method is insensitive to environmental perturbation and simple to implement, it can be used to establish dispersion formula for newly developed optical materials.",
keywords = "Fabry-Perot, Index of refraction, Interference, Optical crystal, Optical material",
author = "Choi, {Hee Joo} and Lim, {Hwan Hong} and Bae, {In Ho} and Moon, {Han Seb} and Myoungsik Cha and Eom, {Tae Bong} and Ju, {Jung Jin}",
year = "2009",
language = "English (US)",
isbn = "9781424438303",
series = "Optics InfoBase Conference Papers",
booktitle = "Conference on Lasers and Electro-Optics/Pacific Rim, CLEOPR 2009",
note = "Conference on Lasers and Electro-Optics/Pacific Rim, CLEOPR 2009 ; Conference date: 30-08-2009 Through 03-09-2009",
}