Determination of refractive indices of optical wafers by interferometric method

Hee Joo Choi; Hwan Hong Lim; In Ho Bae; Han Seb Moon; Myoungsik Cha; Tae Bong Eom; Jung Jin Ju

doi:10.1109/CLEOPR.2009.5292472

Determination of refractive indices of optical wafers by interferometric method

Hee Joo Choi, Hwan Hong Lim, In Ho Bae, Han Seb Moon, Myoungsik Cha, Tae Bong Eom, Jung Jin Ju

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

For accurate index measurement, we investigated Fabry-Perot type interference from optical wafers. Since this method is insensitive to environmental perturbation and simple to implement, it can be used to establish dispersion formula for newly developed optical materials.

Original language	English (US)
Title of host publication	CLEO/Pacific Rim 2009 - 8th Pacific Rim Conference on Lasers and Electro-Optics
DOIs	https://doi.org/10.1109/CLEOPR.2009.5292472
State	Published - 2009
Externally published	Yes
Event	CLEO/Pacific Rim 2009 - 8th Pacific Rim Conference on Lasers and Electro-Optics - Shanghai, China Duration: Aug 30 2009 → Sep 3 2009

Publication series

Name	Pacific Rim Conference on Lasers and Electro-Optics, CLEO - Technical Digest

Other

Other	CLEO/Pacific Rim 2009 - 8th Pacific Rim Conference on Lasers and Electro-Optics
Country/Territory	China
City	Shanghai
Period	8/30/09 → 9/3/09

Keywords

Fabry-Perot
Index of refraction
Interference
Optical crystal
Optical material

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Atomic and Molecular Physics, and Optics
Condensed Matter Physics
Electrical and Electronic Engineering

Access to Document

10.1109/CLEOPR.2009.5292472

Cite this

Choi, H. J., Lim, H. H., Bae, I. H., Moon, H. S., Cha, M., Eom, T. B., & Ju, J. J. (2009). Determination of refractive indices of optical wafers by interferometric method. In CLEO/Pacific Rim 2009 - 8th Pacific Rim Conference on Lasers and Electro-Optics Article 5292472 (Pacific Rim Conference on Lasers and Electro-Optics, CLEO - Technical Digest). https://doi.org/10.1109/CLEOPR.2009.5292472

Determination of refractive indices of optical wafers by interferometric method. / Choi, Hee Joo; Lim, Hwan Hong; Bae, In Ho et al.
CLEO/Pacific Rim 2009 - 8th Pacific Rim Conference on Lasers and Electro-Optics. 2009. 5292472 (Pacific Rim Conference on Lasers and Electro-Optics, CLEO - Technical Digest).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Choi, HJ, Lim, HH, Bae, IH, Moon, HS, Cha, M, Eom, TB & Ju, JJ 2009, Determination of refractive indices of optical wafers by interferometric method. in CLEO/Pacific Rim 2009 - 8th Pacific Rim Conference on Lasers and Electro-Optics., 5292472, Pacific Rim Conference on Lasers and Electro-Optics, CLEO - Technical Digest, CLEO/Pacific Rim 2009 - 8th Pacific Rim Conference on Lasers and Electro-Optics, Shanghai, China, 8/30/09. https://doi.org/10.1109/CLEOPR.2009.5292472

@inproceedings{c7c2ef03c2dd4e47bdd55d0a509e411d,

title = "Determination of refractive indices of optical wafers by interferometric method",

abstract = "For accurate index measurement, we investigated Fabry-Perot type interference from optical wafers. Since this method is insensitive to environmental perturbation and simple to implement, it can be used to establish dispersion formula for newly developed optical materials.",

keywords = "Fabry-Perot, Index of refraction, Interference, Optical crystal, Optical material",

author = "Choi, {Hee Joo} and Lim, {Hwan Hong} and Bae, {In Ho} and Moon, {Han Seb} and Myoungsik Cha and Eom, {Tae Bong} and Ju, {Jung Jin}",

year = "2009",

doi = "10.1109/CLEOPR.2009.5292472",

language = "English (US)",

isbn = "9781424438303",

series = "Pacific Rim Conference on Lasers and Electro-Optics, CLEO - Technical Digest",

booktitle = "CLEO/Pacific Rim 2009 - 8th Pacific Rim Conference on Lasers and Electro-Optics",

note = "CLEO/Pacific Rim 2009 - 8th Pacific Rim Conference on Lasers and Electro-Optics ; Conference date: 30-08-2009 Through 03-09-2009",

}

TY - GEN

T1 - Determination of refractive indices of optical wafers by interferometric method

AU - Choi, Hee Joo

AU - Lim, Hwan Hong

AU - Bae, In Ho

AU - Moon, Han Seb

AU - Cha, Myoungsik

AU - Eom, Tae Bong

AU - Ju, Jung Jin

PY - 2009

Y1 - 2009

N2 - For accurate index measurement, we investigated Fabry-Perot type interference from optical wafers. Since this method is insensitive to environmental perturbation and simple to implement, it can be used to establish dispersion formula for newly developed optical materials.

AB - For accurate index measurement, we investigated Fabry-Perot type interference from optical wafers. Since this method is insensitive to environmental perturbation and simple to implement, it can be used to establish dispersion formula for newly developed optical materials.

KW - Fabry-Perot

KW - Index of refraction

KW - Interference

KW - Optical crystal

KW - Optical material

UR - http://www.scopus.com/inward/record.url?scp=71249132347&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=71249132347&partnerID=8YFLogxK

U2 - 10.1109/CLEOPR.2009.5292472

DO - 10.1109/CLEOPR.2009.5292472

M3 - Conference contribution

AN - SCOPUS:71249132347

SN - 9781424438303

T3 - Pacific Rim Conference on Lasers and Electro-Optics, CLEO - Technical Digest

BT - CLEO/Pacific Rim 2009 - 8th Pacific Rim Conference on Lasers and Electro-Optics

T2 - CLEO/Pacific Rim 2009 - 8th Pacific Rim Conference on Lasers and Electro-Optics

Y2 - 30 August 2009 through 3 September 2009

ER -

Determination of refractive indices of optical wafers by interferometric method

Abstract

Publication series

Other

Keywords

ASJC Scopus subject areas

Access to Document

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