Determination of refractive indices of optical wafers by interferometric method

Hee Joo Choi, Hwan Hong Lim, In Ho Bae, Han Seb Moon, Myoungsik Cha, Tae Bong Eom, Jung Jin Ju

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

For accurate index measurement, we investigated Fabry-Perot type interference from optical wafers. Since this method is insensitive to environmental perturbation and simple to implement, it can be used to establish dispersion formula for newly developed optical materials.

Original languageEnglish (US)
Title of host publicationCLEO/Pacific Rim 2009 - 8th Pacific Rim Conference on Lasers and Electro-Optics
DOIs
StatePublished - 2009
Externally publishedYes
EventCLEO/Pacific Rim 2009 - 8th Pacific Rim Conference on Lasers and Electro-Optics - Shanghai, China
Duration: Aug 30 2009Sep 3 2009

Publication series

NamePacific Rim Conference on Lasers and Electro-Optics, CLEO - Technical Digest

Other

OtherCLEO/Pacific Rim 2009 - 8th Pacific Rim Conference on Lasers and Electro-Optics
Country/TerritoryChina
CityShanghai
Period8/30/099/3/09

Keywords

  • Fabry-Perot
  • Index of refraction
  • Interference
  • Optical crystal
  • Optical material

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

Fingerprint

Dive into the research topics of 'Determination of refractive indices of optical wafers by interferometric method'. Together they form a unique fingerprint.

Cite this