Determination of refractive index of transparent plate by fabry-perot fringe analysis

Hee Joo Choi; Hwan Hong Lim; Han Seb Moon; Tae Bong Eom; Jung Jin Ju; Myoungsik Cha

doi:10.1117/12.862363

Determination of refractive index of transparent plate by fabry-perot fringe analysis

Hee Joo Choi, Hwan Hong Lim, Han Seb Moon, Tae Bong Eom, Jung Jin Ju, Myoungsik Cha

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

1 Scopus citations

Abstract

We developed a simple and accurate method for measuring the refractive indices of transparent plates by analyzing the transmitted fringe pattern as a function of angle of incidence. By using two different wavelengths, we resolved the 2π- ambiguity inherent to the phase measurement involving a thick medium, leading to independent determination of the absolute index of refraction and the thickness with a relative uncertainty smaller than 10^-5 for a 1 mm-thick fused silica plate. The accuracy of our method was confirmed with a standard reference material.

Original language	English (US)
Title of host publication	Interferometry XV
Subtitle of host publication	Techniques and Analysis
DOIs	https://doi.org/10.1117/12.862363
State	Published - 2010
Externally published	Yes
Event	Interferometry XV: Techniques and Analysis - San Diego, CA, United States Duration: Aug 2 2010 → Aug 4 2010

Publication series

Name	Proceedings of SPIE - The International Society for Optical Engineering
Volume	7790
ISSN (Print)	0277-786X

Other

Other	Interferometry XV: Techniques and Analysis
Country/Territory	United States
City	San Diego, CA
Period	8/2/10 → 8/4/10

Keywords

Index of refraction
Interferometry
Metrology

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Computer Science Applications
Applied Mathematics
Electrical and Electronic Engineering

Access to Document

10.1117/12.862363

Cite this

Determination of refractive index of transparent plate by fabry-perot fringe analysis. / Choi, Hee Joo; Lim, Hwan Hong; Moon, Han Seb; Eom, Tae Bong; Ju, Jung Jin; Cha, Myoungsik.

Interferometry XV: Techniques and Analysis. 2010. 77900Z (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 7790).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Choi, HJ, Lim, HH, Moon, HS, Eom, TB, Ju, JJ & Cha, M 2010, Determination of refractive index of transparent plate by fabry-perot fringe analysis. in Interferometry XV: Techniques and Analysis., 77900Z, Proceedings of SPIE - The International Society for Optical Engineering, vol. 7790, Interferometry XV: Techniques and Analysis, San Diego, CA, United States, 8/2/10. https://doi.org/10.1117/12.862363

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abstract = "We developed a simple and accurate method for measuring the refractive indices of transparent plates by analyzing the transmitted fringe pattern as a function of angle of incidence. By using two different wavelengths, we resolved the 2π- ambiguity inherent to the phase measurement involving a thick medium, leading to independent determination of the absolute index of refraction and the thickness with a relative uncertainty smaller than 10-5 for a 1 mm-thick fused silica plate. The accuracy of our method was confirmed with a standard reference material.",

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language = "English (US)",

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AU - Choi, Hee Joo

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AU - Ju, Jung Jin

AU - Cha, Myoungsik

PY - 2010

Y1 - 2010

N2 - We developed a simple and accurate method for measuring the refractive indices of transparent plates by analyzing the transmitted fringe pattern as a function of angle of incidence. By using two different wavelengths, we resolved the 2π- ambiguity inherent to the phase measurement involving a thick medium, leading to independent determination of the absolute index of refraction and the thickness with a relative uncertainty smaller than 10-5 for a 1 mm-thick fused silica plate. The accuracy of our method was confirmed with a standard reference material.

AB - We developed a simple and accurate method for measuring the refractive indices of transparent plates by analyzing the transmitted fringe pattern as a function of angle of incidence. By using two different wavelengths, we resolved the 2π- ambiguity inherent to the phase measurement involving a thick medium, leading to independent determination of the absolute index of refraction and the thickness with a relative uncertainty smaller than 10-5 for a 1 mm-thick fused silica plate. The accuracy of our method was confirmed with a standard reference material.

KW - Index of refraction

KW - Interferometry

KW - Metrology

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DO - 10.1117/12.862363

M3 - Conference contribution

AN - SCOPUS:78649953178

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T3 - Proceedings of SPIE - The International Society for Optical Engineering

BT - Interferometry XV

T2 - Interferometry XV: Techniques and Analysis

Y2 - 2 August 2010 through 4 August 2010

ER -

Determination of refractive index of transparent plate by fabry-perot fringe analysis

Abstract

Publication series

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Keywords

ASJC Scopus subject areas

Access to Document

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