@inproceedings{dc870e57be9e40aaa4ef01fa0da979f5,
title = "Determination of refractive index of transparent plate by fabry-perot fringe analysis",
abstract = "We developed a simple and accurate method for measuring the refractive indices of transparent plates by analyzing the transmitted fringe pattern as a function of angle of incidence. By using two different wavelengths, we resolved the 2π- ambiguity inherent to the phase measurement involving a thick medium, leading to independent determination of the absolute index of refraction and the thickness with a relative uncertainty smaller than 10-5 for a 1 mm-thick fused silica plate. The accuracy of our method was confirmed with a standard reference material.",
keywords = "Index of refraction, Interferometry, Metrology",
author = "Choi, {Hee Joo} and Lim, {Hwan Hong} and Moon, {Han Seb} and Eom, {Tae Bong} and Ju, {Jung Jin} and Myoungsik Cha",
year = "2010",
doi = "10.1117/12.862363",
language = "English (US)",
isbn = "9780819482860",
series = "Proceedings of SPIE - The International Society for Optical Engineering",
booktitle = "Interferometry XV",
note = "Interferometry XV: Techniques and Analysis ; Conference date: 02-08-2010 Through 04-08-2010",
}