Determination of refractive index of transparent plate by fabry-perot fringe analysis

Hee Joo Choi, Hwan Hong Lim, Han Seb Moon, Tae Bong Eom, Jung Jin Ju, Myoungsik Cha

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Abstract

We developed a simple and accurate method for measuring the refractive indices of transparent plates by analyzing the transmitted fringe pattern as a function of angle of incidence. By using two different wavelengths, we resolved the 2π- ambiguity inherent to the phase measurement involving a thick medium, leading to independent determination of the absolute index of refraction and the thickness with a relative uncertainty smaller than 10-5 for a 1 mm-thick fused silica plate. The accuracy of our method was confirmed with a standard reference material.

Original languageEnglish (US)
Title of host publicationInterferometry XV
Subtitle of host publicationTechniques and Analysis
DOIs
StatePublished - 2010
Externally publishedYes
EventInterferometry XV: Techniques and Analysis - San Diego, CA, United States
Duration: Aug 2 2010Aug 4 2010

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume7790
ISSN (Print)0277-786X

Other

OtherInterferometry XV: Techniques and Analysis
Country/TerritoryUnited States
CitySan Diego, CA
Period8/2/108/4/10

Keywords

  • Index of refraction
  • Interferometry
  • Metrology

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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