Determination of average refractive index of spin-coated DCG films for HOE fabrication

T. J. Kim, Eugene W. Campbell, Raymond K. Kostuk

Research output: Chapter in Book/Report/Conference proceedingConference contribution

5 Scopus citations

Abstract

The refractive index of holographic emulsions is an important parameter needed for designing holographic optical elements (HOEs). In this paper theoretical calculations of the accuracy required for the refractive index and thickness of emulsions needed to meet predetermined Bragg angle conditions are presented. A modified interferometric method is used to find average refractive index of the unexposed and the developed dichromated gelatin holographic films. Slanted transmission HOEs are designed considering the index and thickness variations, and used to verify the index measurement results. The Brewster angle method is used to measure surface index of the unexposed and the developed films. The differences between average index and surface index are discussed. Theoretical calculation of the effects of index variation on diffraction efficiency, and experimental results for index modulation variation caused by process changes are also presented.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
PublisherPubl by Society of Photo-Optical Instrumentation Engineers
Pages91-100
Number of pages10
ISBN (Print)0819411477, 9780819411471
DOIs
StatePublished - 1993
EventProceedings of the Practical Holography VII: Imaging and Materials - San Jose, CA, USA
Duration: Feb 1 1993Feb 2 1993

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume1914
ISSN (Print)0277-786X

Other

OtherProceedings of the Practical Holography VII: Imaging and Materials
CitySan Jose, CA, USA
Period2/1/932/2/93

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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