Detective quantum efficiency (DQE) of CZT semiconductor detectors for digital radiography

G. C. Giakos, S. Suryanarayanan, R. Guntupalli, J. Odogba, N. Shah, S. Vedantham, S. Chowdhury, K. Mehta, S. Sumrain, N. Patnekar, A. Moholkar, V. Kumar, R. E. Endorf

Research output: Contribution to conferencePaperpeer-review

Abstract

In this study, the Detective Quantum Efficiency (DQE) of Cadmium Zinc Telluride (CZT) detectors for digital radiography has been measured. Specifically, this study is aimed at investigating the zero frequency DQE(O) under different x-ray tube and detector parameters. The experimental results indicate good DQE(0), although the detector system is limited by current manufacturing techniques.

Original languageEnglish (US)
Pages664-668
Number of pages5
StatePublished - 2003
Externally publishedYes
EventProceedings of the 20th IEEE Information and Measurement Technology Conference - Vail, CO, United States
Duration: May 20 2003May 22 2003

Conference

ConferenceProceedings of the 20th IEEE Information and Measurement Technology Conference
Country/TerritoryUnited States
CityVail, CO
Period5/20/035/22/03

ASJC Scopus subject areas

  • Instrumentation

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