Detective quantum efficiency (DQE) of CZT semiconductor detectors for digital radiography

G. C. Giakos; S. Suryanarayanan; R. Guntupalli; J. Odogba; N. Shah; S. Vedantham; S. Chowdhury; K. Mehta; S. Sumrain; N. Patnekar; A. Moholkar; V. Kumar; R. E. Endorf

Detective quantum efficiency (DQE) of CZT semiconductor detectors for digital radiography

G. C. Giakos, S. Suryanarayanan, R. Guntupalli, J. Odogba, N. Shah, S. Vedantham, S. Chowdhury, K. Mehta, S. Sumrain, N. Patnekar, A. Moholkar, V. Kumar, R. E. Endorf

Research output: Contribution to conference › Paper › peer-review

Abstract

In this study, the Detective Quantum Efficiency (DQE) of Cadmium Zinc Telluride (CZT) detectors for digital radiography has been measured. Specifically, this study is aimed at investigating the zero frequency DQE(O) under different x-ray tube and detector parameters. The experimental results indicate good DQE(0), although the detector system is limited by current manufacturing techniques.

Original language	English (US)
Pages	664-668
Number of pages	5
State	Published - 2003
Externally published	Yes
Event	Proceedings of the 20th IEEE Information and Measurement Technology Conference - Vail, CO, United States Duration: May 20 2003 → May 22 2003

Conference

Conference	Proceedings of the 20th IEEE Information and Measurement Technology Conference
Country/Territory	United States
City	Vail, CO
Period	5/20/03 → 5/22/03

ASJC Scopus subject areas

Electrical and Electronic Engineering

Cite this

Giakos, G. C., Suryanarayanan, S., Guntupalli, R., Odogba, J., Shah, N., Vedantham, S., Chowdhury, S., Mehta, K., Sumrain, S., Patnekar, N., Moholkar, A., Kumar, V., & Endorf, R. E. (2003). Detective quantum efficiency (DQE) of CZT semiconductor detectors for digital radiography. 664-668. Paper presented at Proceedings of the 20th IEEE Information and Measurement Technology Conference, Vail, CO, United States.

Giakos, GC, Suryanarayanan, S, Guntupalli, R, Odogba, J, Shah, N, Vedantham, S, Chowdhury, S, Mehta, K, Sumrain, S, Patnekar, N, Moholkar, A, Kumar, V & Endorf, RE 2003, 'Detective quantum efficiency (DQE) of CZT semiconductor detectors for digital radiography', Paper presented at Proceedings of the 20th IEEE Information and Measurement Technology Conference, Vail, CO, United States, 5/20/03 - 5/22/03 pp. 664-668.

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abstract = "In this study, the Detective Quantum Efficiency (DQE) of Cadmium Zinc Telluride (CZT) detectors for digital radiography has been measured. Specifically, this study is aimed at investigating the zero frequency DQE(O) under different x-ray tube and detector parameters. The experimental results indicate good DQE(0), although the detector system is limited by current manufacturing techniques.",

author = "Giakos, {G. C.} and S. Suryanarayanan and R. Guntupalli and J. Odogba and N. Shah and S. Vedantham and S. Chowdhury and K. Mehta and S. Sumrain and N. Patnekar and A. Moholkar and V. Kumar and Endorf, {R. E.}",

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note = "Proceedings of the 20th IEEE Information and Measurement Technology Conference ; Conference date: 20-05-2003 Through 22-05-2003",

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TY - CONF

T1 - Detective quantum efficiency (DQE) of CZT semiconductor detectors for digital radiography

AU - Giakos, G. C.

AU - Suryanarayanan, S.

AU - Guntupalli, R.

AU - Odogba, J.

AU - Shah, N.

AU - Vedantham, S.

AU - Chowdhury, S.

AU - Mehta, K.

AU - Sumrain, S.

AU - Patnekar, N.

AU - Moholkar, A.

AU - Kumar, V.

AU - Endorf, R. E.

PY - 2003

Y1 - 2003

N2 - In this study, the Detective Quantum Efficiency (DQE) of Cadmium Zinc Telluride (CZT) detectors for digital radiography has been measured. Specifically, this study is aimed at investigating the zero frequency DQE(O) under different x-ray tube and detector parameters. The experimental results indicate good DQE(0), although the detector system is limited by current manufacturing techniques.

AB - In this study, the Detective Quantum Efficiency (DQE) of Cadmium Zinc Telluride (CZT) detectors for digital radiography has been measured. Specifically, this study is aimed at investigating the zero frequency DQE(O) under different x-ray tube and detector parameters. The experimental results indicate good DQE(0), although the detector system is limited by current manufacturing techniques.

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M3 - Paper

AN - SCOPUS:0038168965

SP - 664

EP - 668

T2 - Proceedings of the 20th IEEE Information and Measurement Technology Conference

Y2 - 20 May 2003 through 22 May 2003

ER -

Detective quantum efficiency (DQE) of CZT semiconductor detectors for digital radiography

Abstract

Conference

ASJC Scopus subject areas

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