Detected contrast and dynamic range measurements of CdZnTe semiconductors for flat-panel digital radiography

George C. Giakos, R. Guntupalli, N. Shah, S. Vedantham, S. Suryanarayanan, S. Chowdhury, R. Nemer, A. G. Passerini, K. Mehta, S. Sumrain, N. Patnekar, K. Nataraj, E. A. Evans, R. Endorf, Fabrizio Russo

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