Design of wide-field imaging shack Hartmann testbed

Lauren H. Schatz, R. Phillip Scott, Ryan S. Bronson, Lucas R.W. Sanchez, Michael Hart

Research output: Chapter in Book/Report/Conference proceedingConference contribution


Standard adaptive optics systems measure the aberrations in the wavefronts of a beacon guide star caused by atmospheric turbulence, which limits the corrected field of view to the isoplanatic patch, the solid angle over which the optical aberration is roughly constant. For imaging systems that require a corrected field of view larger than the isoplanatic angle, a three-dimensional estimate of the aberration is required. We are developing a wide-field imaging Shack-Hartmann wavefront sensor (WFS) that will characterize turbulence over a large field of view tens of times the size of the isoplanatic angle. The technique will find application in horizontal and downward looking remote sensing scenarios where high resolution imaging through extended atmospheric turbulence is required. The laboratory prototype system consists of a scene generator, turbulence simulator, a Shack Hartman WFS arm, and an imaging arm. The system has a high intrinsic Strehl ratio, is telecentric, and diffraction limited. We present preliminary data and analysis from the system.

Original languageEnglish (US)
Title of host publicationUnconventional Imaging and Wavefront Sensing XII
EditorsDavid C. Dayton, Thomas J. Karr, Jean J. Dolne
ISBN (Electronic)9781510603554
StatePublished - 2016
EventUnconventional Imaging and Wavefront Sensing XII - San Diego, United States
Duration: Aug 31 2016Sep 1 2016

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X


ConferenceUnconventional Imaging and Wavefront Sensing XII
Country/TerritoryUnited States
CitySan Diego


  • Aberrations
  • Imaging
  • Shack Hartmann
  • Turbulance
  • Wavefront Sensor

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering


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