Abstract
As reliability requirements become increasingly demanding for many engineering systems, conventional system reliability demonstration testing (SRDT) based on the number of failures depends on a large sample of system units. However, for many safety critical systems, such as missiles, it is prohibitive to perform such testing with large samples. To reduce the sample size, existing SRDT methods utilize test data from either system level or component level. In this paper, an aggregation-based SRDT methodology is proposed for hierarchical systems by utilizing multilevel reliability information of components, subsystems, and the overall system. Analytical conditions are identified for the proposed method to achieve lower consumer risk. The performances of different SRDT design strategies are evaluated and compared according to their consumer risks. A numerical case study is presented to illustrate the proposed methodology and demonstrate its validity and effectiveness.
Original language | English (US) |
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Article number | 7752922 |
Pages (from-to) | 135-147 |
Number of pages | 13 |
Journal | IEEE Transactions on Reliability |
Volume | 66 |
Issue number | 1 |
DOIs | |
State | Published - Mar 2017 |
Keywords
- Bayesian reliability
- hierarchical series-parallel system
- independent test trials
- prior specification
- success-failure test
ASJC Scopus subject areas
- Safety, Risk, Reliability and Quality
- Electrical and Electronic Engineering