Abstract
By taking a new look at an old concept, we have shown in our previous work how the Abbe sine condition can be used to measure linearly field-dependent aberrations in order to verify the alignment of optical systems. In this paper, we expand on this method and discuss the design choices involved in implementing the sine condition test (SCTest). Specifically, we discuss the two illumination options for the test: point source with a grating or flat-panel display, and we discuss the tradeoffs of the two approaches. Additionally, experimental results are shown using a flat-panel display to measure linearly fielddependent aberrations. Last, we elaborate on how to implement the SCTest on more complex optical systems, such as a three-mirror anastigmat and a double Gauss imaging lens system.
Original language | English (US) |
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Pages (from-to) | 7099-7108 |
Number of pages | 10 |
Journal | Applied optics |
Volume | 52 |
Issue number | 29 |
DOIs | |
State | Published - Oct 10 2013 |
ASJC Scopus subject areas
- Atomic and Molecular Physics, and Optics
- Engineering (miscellaneous)
- Electrical and Electronic Engineering