De Broglie wave-front curvature induced by electric-field gradients and its effect on precision measurements with an atom interferometer

Ivan Hromada; Raisa Trubko; William F. Holmgren; Maxwell D. Gregoire; Alexander D. Cronin

doi:10.1103/PhysRevA.89.033612

De Broglie wave-front curvature induced by electric-field gradients and its effect on precision measurements with an atom interferometer

Ivan Hromada, Raisa Trubko, William F. Holmgren, Maxwell D. Gregoire, Alexander D. Cronin

Hydrology and Atmospheric Science

Research output: Contribution to journal › Article › peer-review

5 Scopus citations

Abstract

To improve precision measurements made with atom interferometers, the effect of de Broglie wave-front curvature induced by a lens inside an atom interferometer is experimentally demonstrated and theoretically analyzed. Electrostatic lenses shift, magnify, and distort atom interference fringes, which modifies the phase and the contrast of the interference signals. Informed by these observations, an improved method is presented for analyzing measurements of atomic beam velocity distributions using phase choppers [W. F. Holmgren, I. Hromada, C. E. Klauss, and A. D. Cronin, New J. Phys. 13, 115007 (2011)NJOPFM1367-263010.1088/1367-2630/13/11/115007].

Original language	English (US)
Article number	033612
Journal	Physical Review A - Atomic, Molecular, and Optical Physics
Volume	89
Issue number	3
DOIs	https://doi.org/10.1103/PhysRevA.89.033612
State	Published - Mar 10 2014

ASJC Scopus subject areas

Atomic and Molecular Physics, and Optics

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10.1103/PhysRevA.89.033612

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title = "De Broglie wave-front curvature induced by electric-field gradients and its effect on precision measurements with an atom interferometer",

abstract = "To improve precision measurements made with atom interferometers, the effect of de Broglie wave-front curvature induced by a lens inside an atom interferometer is experimentally demonstrated and theoretically analyzed. Electrostatic lenses shift, magnify, and distort atom interference fringes, which modifies the phase and the contrast of the interference signals. Informed by these observations, an improved method is presented for analyzing measurements of atomic beam velocity distributions using phase choppers [W. F. Holmgren, I. Hromada, C. E. Klauss, and A. D. Cronin, New J. Phys. 13, 115007 (2011)NJOPFM1367-263010.1088/1367-2630/13/11/115007].",

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T1 - De Broglie wave-front curvature induced by electric-field gradients and its effect on precision measurements with an atom interferometer

AU - Hromada, Ivan

AU - Trubko, Raisa

AU - Holmgren, William F.

AU - Gregoire, Maxwell D.

AU - Cronin, Alexander D.

PY - 2014/3/10

Y1 - 2014/3/10

N2 - To improve precision measurements made with atom interferometers, the effect of de Broglie wave-front curvature induced by a lens inside an atom interferometer is experimentally demonstrated and theoretically analyzed. Electrostatic lenses shift, magnify, and distort atom interference fringes, which modifies the phase and the contrast of the interference signals. Informed by these observations, an improved method is presented for analyzing measurements of atomic beam velocity distributions using phase choppers [W. F. Holmgren, I. Hromada, C. E. Klauss, and A. D. Cronin, New J. Phys. 13, 115007 (2011)NJOPFM1367-263010.1088/1367-2630/13/11/115007].

AB - To improve precision measurements made with atom interferometers, the effect of de Broglie wave-front curvature induced by a lens inside an atom interferometer is experimentally demonstrated and theoretically analyzed. Electrostatic lenses shift, magnify, and distort atom interference fringes, which modifies the phase and the contrast of the interference signals. Informed by these observations, an improved method is presented for analyzing measurements of atomic beam velocity distributions using phase choppers [W. F. Holmgren, I. Hromada, C. E. Klauss, and A. D. Cronin, New J. Phys. 13, 115007 (2011)NJOPFM1367-263010.1088/1367-2630/13/11/115007].

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De Broglie wave-front curvature induced by electric-field gradients and its effect on precision measurements with an atom interferometer

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