Data extraction from terahertz time domain spectroscopy measurements

Maik Scheller

doi:10.1007/s10762-014-0053-4

Data extraction from terahertz time domain spectroscopy measurements

Maik Scheller

Optical Sciences, College of

Research output: Contribution to journal › Review article › peer-review

56 Scopus citations

Abstract

The potential of terahertz (THz) time domain spectroscopy to simultaneously determine the complex dielectric parameters of materials and their geometrical thickness is of high interest for scientific spectroscopy and for general metrology. This paper provides an overview of the background of the data extraction from THz measurements and discusses the accuracy and ambiguity of this extraction process. It is shown that the signal to noise ratio of the measurement as well as the bandwidth of the accessible THz spectrum define the limitation of the achievable accuracy in the data extraction.

Original language	English (US)
Pages (from-to)	638-648
Number of pages	11
Journal	Journal of Infrared, Millimeter, and Terahertz Waves
Volume	35
Issue number	8
DOIs	https://doi.org/10.1007/s10762-014-0053-4
State	Published - Aug 2014

Keywords

Data analysis
Fabry-Perót
Parameter extraction
Terahertz
Thickness determination

ASJC Scopus subject areas

Radiation
Instrumentation
Condensed Matter Physics
Electrical and Electronic Engineering

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10.1007/s10762-014-0053-4

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AB - The potential of terahertz (THz) time domain spectroscopy to simultaneously determine the complex dielectric parameters of materials and their geometrical thickness is of high interest for scientific spectroscopy and for general metrology. This paper provides an overview of the background of the data extraction from THz measurements and discusses the accuracy and ambiguity of this extraction process. It is shown that the signal to noise ratio of the measurement as well as the bandwidth of the accessible THz spectrum define the limitation of the achievable accuracy in the data extraction.

KW - Data analysis

KW - Fabry-Perót

KW - Parameter extraction

KW - Terahertz

KW - Thickness determination

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JO - Journal of Infrared, Millimeter, and Terahertz Waves

JF - Journal of Infrared, Millimeter, and Terahertz Waves

IS - 8

ER -

Data extraction from terahertz time domain spectroscopy measurements

Abstract

Keywords

ASJC Scopus subject areas

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