Abstract
The results obtained in a novel, two-laser static tester are described, which allows real time monitoring of the crystallization/amorphization processes both during the laser pulse and in the cooling period following the pulse. The two-laser static tester is based on a commercial white light microscope. Crystallization/amorphization studies were conducted for the thermal characterization of phase change media on a set of five quadrilayer samples. The samples have varying thicknesses of GeSbTe and dielectric layers.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 211-213 |
| Number of pages | 3 |
| Journal | Proceedings of SPIE - The International Society for Optical Engineering |
| Volume | 3864 |
| State | Published - 1999 |
| Event | Proceedings of the 1999 Joint International Symposium on Optical Memory and Optical Optical Data Storage (ISOM/ODS'99) - Koloa, HI, USA Duration: Jul 12 1999 → Jul 15 1999 |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Computer Science Applications
- Applied Mathematics
- Electrical and Electronic Engineering