Critical pressure for weakening of size-induced stiffness in spinel-structure Si3N4 nanocrystals

Zhongwu Wang; Yusheng Zhao; David Schiferl; C. S. Zha; Robert T. Downs; T. Sekine

doi:10.1063/1.1618365

Critical pressure for weakening of size-induced stiffness in spinel-structure Si₃N₄ nanocrystals

Zhongwu Wang
, Yusheng Zhao
, David Schiferl
, C. S. Zha
, Robert T. Downs
, T. Sekine

Geosciences

Research output: Contribution to journal › Article › peer-review

20 Scopus citations

Abstract

A study was performed on the critical pressure for weakening of size-induced stiffness in spinel-structure Si₃N₄ nanocrystals. Raman spectroscopy, x-ray diffraction analysis and transmission electron microscopy were used for the study. The results showed that upon decompression, the bulk modulus of the spinel remained at its lower value of 415 GPa.

Original language	English (US)
Pages (from-to)	3174-3176
Number of pages	3
Journal	Applied Physics Letters
Volume	83
Issue number	15
DOIs	https://doi.org/10.1063/1.1618365
State	Published - Oct 13 2003

ASJC Scopus subject areas

Physics and Astronomy (miscellaneous)

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10.1063/1.1618365

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title = "Critical pressure for weakening of size-induced stiffness in spinel-structure Si3N4 nanocrystals",

abstract = "A study was performed on the critical pressure for weakening of size-induced stiffness in spinel-structure Si3N4 nanocrystals. Raman spectroscopy, x-ray diffraction analysis and transmission electron microscopy were used for the study. The results showed that upon decompression, the bulk modulus of the spinel remained at its lower value of 415 GPa.",

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AU - Schiferl, David

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AU - Downs, Robert T.

AU - Sekine, T.

PY - 2003/10/13

Y1 - 2003/10/13

N2 - A study was performed on the critical pressure for weakening of size-induced stiffness in spinel-structure Si3N4 nanocrystals. Raman spectroscopy, x-ray diffraction analysis and transmission electron microscopy were used for the study. The results showed that upon decompression, the bulk modulus of the spinel remained at its lower value of 415 GPa.

AB - A study was performed on the critical pressure for weakening of size-induced stiffness in spinel-structure Si3N4 nanocrystals. Raman spectroscopy, x-ray diffraction analysis and transmission electron microscopy were used for the study. The results showed that upon decompression, the bulk modulus of the spinel remained at its lower value of 415 GPa.

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JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 15

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Critical pressure for weakening of size-induced stiffness in spinel-structure Si₃N₄ nanocrystals

Abstract

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