Coupled noise estimation for distributed RC interconnect model

Janet M. Wang, Qingjian Yu, Ernest S. Kuh

Research output: Contribution to journalConference articlepeer-review

3 Scopus citations


With the increase in signal speed and the development of process technology, distributed RC line model is found to be more suitable for on-chip interconnects than lumped RC model, especially for interconnects around and below 0.25 /spl mu/m. In this paper, we first describe a new explicit form for crosstalk approximation for coupled RC lines. Then we introduce a novel passive model order reduction technique for distributed RC lines. These two parts serve as two steps in static noise analysis of full on-chip interconnect networks called pruning process and static analysis process.

Original languageEnglish (US)
Article number761200
Pages (from-to)664-668
Number of pages5
JournalProceedings -Design, Automation and Test in Europe, DATE
StatePublished - 1999
EventDesign, Automation and Test in Europe Conference and Exhibition 1999, DATE 1999 - Munich, Germany
Duration: Mar 9 1999Mar 12 1999

ASJC Scopus subject areas

  • General Engineering


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