We describe a focused ion beam scanning electron microscope (FIB-SEM) technique that enables coordinated isotopic and mineralogic analysis of planetary materials. We show that site-specific electron-transparent sections can be created and extracted in situ using a microtweezer and demonstrate that they are amenable to analysis by secondary ion mass spectrometry (SIMS), scanning electron microscopy (SEM), and transmission electron microscopy (TEM). These methods greatly advance the ability to address several fundamental questions in meteoritics, such as accretion and alteration histories of chondrules and the origin and history of preserved nebular and presolar materials.
|Original language||English (US)|
|Number of pages||14|
|Journal||Meteoritics and Planetary Science|
|State||Published - 2007|
ASJC Scopus subject areas
- Space and Planetary Science